On the choice of the optimal tuning parameter in robust one-shot device testing analysis
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Publication:2087079
DOI10.1007/978-3-031-04137-2_16zbMath1497.62260OpenAlexW4283578895MaRDI QIDQ2087079
Elena Castilla, Pedro J. Chocano
Publication date: 26 October 2022
Full work available at URL: https://doi.org/10.1007/978-3-031-04137-2_16
Related Items (3)
Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks ⋮ Robust estimation based on one-shot device test data under log-normal lifetimes ⋮ Power divergence approach for one-shot device testing under competing risks
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