The length of single fault detection tests with respect to substitution of gates with inverters

DOI10.1007/S10598-022-09550-5zbMath1499.94076OpenAlexW4229038683MaRDI QIDQ2096004

G. Temerbekova, Dmitry S. Romanov

Publication date: 16 November 2022

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-022-09550-5

zbMATH Keywords

Shannon functionfault detection testcombinational circuitgate substitution

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

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• Single fault detection tests for circuits of functional elements
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
• Lower bounds for the lengths of single tests for Boolean circuits
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Unit checking output tests under constant faults for functional elements
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• ON LOGIC NETWORKS ALLOWING SHORT SINGLE FAULT DETECTION TESTS UNDER ARBITRARY FAULTS OF GATES
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES

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