Comparative analysis of the matrix method and the finite-difference method for modeling the distribution of minority charge carriers in a multilayer planar semiconductor structure

DOI10.1007/S10958-022-06168-1OpenAlexW4309485797MaRDI QIDQ2098821

V. V. Kalmanovich, M. A. Stepovich, E. V. Seregina

Publication date: 22 November 2022

Published in: Journal of Mathematical Sciences (New York) (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10958-022-06168-1

zbMATH Keywords

differential equationsemiconductorfinite-difference methodmathematical modelmatrix methodelectron beammultilayer planar structure

Mathematics Subject Classification ID

Technical applications of optics and electromagnetic theory (78A55) Applications of boundary value problems involving ordinary differential equations (34B60) Linear boundary value problems for ordinary differential equations (34B05) Numerical methods for ordinary differential equations (65Lxx)

Cites Work

• The projection Galerkin method for solving the time-independent differential diffusion equation in a semi-infinite domain
• On a Class of Functions Defined by Partial Differential Equations
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