A semi-quantum approach for modelling the accelerated test data

DOI10.1016/j.apm.2021.11.020zbMath1505.62510OpenAlexW3214896198MaRDI QIDQ2109814

Jiaxiao Zhu, Yunxia Chen, Kunsong Lin

Publication date: 21 December 2022

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2021.11.020

zbMATH Keywords

lifetime uncertaintyaccelerated life testaccelerated failure-time modelproportional decay modelsemi-quantum approach

Mathematics Subject Classification ID

Reliability and life testing (62N05) Open systems, reduced dynamics, master equations, decoherence (81S22)

Cites Work

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• Nonlinear mixed reliability model with non-constant shape parameter of aviation cables
• Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring

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