Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

DOI10.1515/DMA-2022-0001zbMath1492.94228OpenAlexW4213350236MaRDI QIDQ2136299

Iľya G. Lyubich, Dmitry S. Romanov

Publication date: 10 May 2022

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2022-0001

zbMATH Keywords

Shannon functionBoolean circuiteasily testable circuitsingle diagnostic testinversion fault at gate output

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11)

Related Items (2)

Shannon function of the test length with respect to gate input identification ⋮ Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates

Cites Work

• Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
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