Characterizations of non-normalized discrete probability distributions and their application in statistics
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Publication:2136641
DOI10.1214/22-EJS1983zbMath1493.62056arXiv2011.04369OpenAlexW3104675392MaRDI QIDQ2136641
Steffen Betsch, Franz Nestmann, Bruno Ebner
Publication date: 11 May 2022
Published in: Electronic Journal of Statistics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/2011.04369
goodness-of-fit testsnegative binomial distributionStein characterizationsnon-normalized modelsdiscrete exponential-polynomial models
Nonparametric hypothesis testing (62G10) Characterization and structure theory of statistical distributions (62E10)
Related Items (3)
Goodness-of-fit tests for the Weibull distribution based on the Laplace transform and Stein's method ⋮ New characterizations of the (discrete) Lindley distribution and their applications ⋮ Stein's method meets computational statistics: a review of some recent developments
Uses Software
Cites Work
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