Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration
DOI10.1016/j.jcp.2022.111479OpenAlexW4288032470WikidataQ114163226 ScholiaQ114163226MaRDI QIDQ2168299
Won-Kwang Park, Sangwoo Kang, Mikyoung Lim
Publication date: 31 August 2022
Published in: Journal of Computational Physics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jcp.2022.111479
simulation resultsBessel functionsperfectly conducting cracksbistatic measurementsampling-type algorithm
Basic methods for problems in optics and electromagnetic theory (78Mxx) Miscellaneous topics in partial differential equations (35Rxx) General topics in optics and electromagnetic theory (78Axx)
Cites Work
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