Semiparametric point process modeling of blinking artifacts in PALM

DOI10.1214/21-AOAS1553zbMath1498.62226arXiv2101.12285OpenAlexW4286484512MaRDI QIDQ2170406

Ute Hahn, Louis G. Jensen, David J. Williamson

Publication date: 5 September 2022

Published in: The Annals of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/2101.12285

zbMATH Keywords

mark correlation functionsecond-order characteristicsmoment-based estimationmultiple blinkingphotoactivated localization microscopyspatiotemporal point patterns

Mathematics Subject Classification ID

Inference from spatial processes (62M30) Applications of statistics to biology and medical sciences; meta analysis (62P10) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55)

Cites Work

• Statistical molecule counting in super-resolution fluorescence microscopy: towards quantitative nanoscopy
• A hidden Markov model approach to characterizing the photo-switching behavior of fluorophores
• On Correlations of Marked Point Processes
• The second-order analysis of stationary point processes
• Global Envelope Tests for Spatial Processes
• An Introduction to the Theory of Point Processes

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