Simulation of dynamical processes in long Josephson junctions: computation of current-voltage characteristics and round error growth estimation for a second-order difference scheme

DOI10.1134/S0965542519120157zbMath1451.78045OpenAlexW3013512905MaRDI QIDQ2206420

S. I. Serdyukova

Publication date: 22 October 2020

Published in: Computational Mathematics and Mathematical Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s0965542519120157

zbMATH Keywords

Cauchy problemfinite-difference schemeslong Josephson junctionscalculation of current-voltage characteristicsestimate of growth rate for layer-to-layer transition operator

Mathematics Subject Classification ID

Finite difference methods applied to problems in optics and electromagnetic theory (78M20) Multistep, Runge-Kutta and extrapolation methods for ordinary differential equations (65L06) Technical applications of optics and electromagnetic theory (78A55)

Related Items (2)

Numerical method for estimating the growth rate of the rounding error in uniform metric ⋮ Simulation of dynamic processes in long Josephson junctions. The problem on calculating the current-voltage characteristics. Numerical method for estimating the round-off error growth rate

Cites Work

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