About the reliability of circuits under failures of type 0 at the outputs of elements in a complete finite basis containing some pairs of functions
DOI10.3103/S1066369X20070026zbMath1466.94069OpenAlexW3049186115WikidataQ114039197 ScholiaQ114039197MaRDI QIDQ2225872
M. A. Alekhina, T. A. Shornikova
Publication date: 11 February 2021
Published in: Russian Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.3103/s1066369x20070026
reliability and unreliability of circuitsynthesis of circuits composed of unreliable gatesunreliable functional gates
Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11)
Cites Work
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