Bayesian accelerated life test plans for series systems with Weibull component lifetimes
DOI10.1016/j.apm.2018.06.007zbMath1462.62609OpenAlexW2808303475WikidataQ129656981 ScholiaQ129656981MaRDI QIDQ2306784
Publication date: 26 March 2020
Published in: Applied Mathematical Modelling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.apm.2018.06.007
Weibull distributioncompeting risksgeneral equivalence theoremgamma frailty modelBayesian \(C\)-optimalityBayesian \(D\)-optimality
Optimal statistical designs (62K05) Bayesian inference (62F15) Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)
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- Bayesian accelerated life testing under competing log-location-scale family of causes of failure
- Optimal Bayesian design applied to logistic regression experiments
- Bayesian design for accelerated life testing
- Simulation-based designs for accelerated life tests
- Bayesian experimental design: A review
- Accelerated life test planning with independent lognormal competing risks
- Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions
- Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure
- A nonidentifiability aspect of the problem of competing risks.
- The Equivalence of Constrained and Weighted Designs in Multiple Objective Design Problems
- Life Tests under Dependent Competing Causes of Failure
- BayesianD-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure
- Locally Optimal Designs for Estimating Parameters
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