An a posteriori error estimate for scanning electron microscope simulation with adaptive mesh refinement

DOI10.1007/s10915-019-00995-2zbMath1428.65091OpenAlexW2961647019WikidataQ90283175 ScholiaQ90283175MaRDI QIDQ2330678

William F. Mitchell, John S. Villarrubia

Publication date: 22 October 2019

Published in: Journal of Scientific Computing (Search for Journal in Brave)

Full work available at URL: http://europepmc.org/articles/pmc7067220

zbMATH Keywords

adaptive mesh refinementfinite element analysisa posteriori error estimationscanning electron microscope simulation

Mathematics Subject Classification ID

Error bounds for boundary value problems involving PDEs (65N15) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Mesh generation, refinement, and adaptive methods for boundary value problems involving PDEs (65N50) Electro- and magnetostatics (78A30) Electron optics (78A15)

Uses Software

• Gmsh
• PHAML

Cites Work

• Unnamed Item
• Unnamed Item
• Unnamed Item
• Gmsh: A 3-D finite element mesh generator with built-in pre- and post-processing facilities
• Some A Posteriori Error Estimators for Elliptic Partial Differential Equations
• Locally Adapted Tetrahedral Meshes Using Bisection