Short single tests for circuits with arbitrary stuck-at faults at outputs of gates

DOI10.1515/DMA-2019-0030zbMath1490.94087OpenAlexW2982156900MaRDI QIDQ2332897

Kirill A. Popkov

Publication date: 5 November 2019

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2019-0030

zbMATH Keywords

stuck-at faultsingle fault detection testcircuit of gatessingle diagnostic test

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11) Boolean functions (94D10)

Related Items (5)

The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ On self-correcting logic circuits of unreliable gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder ⋮ The length of single fault detection tests with respect to substitution of gates with inverters ⋮ On self-correcting logic circuits of unreliable gates with at most two inputs

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• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
• On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
• Easily Testable Realizations ror Logic Functions

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