Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements

DOI10.3103/S0278641915010057zbMath1357.94111MaRDI QIDQ2356509

Dmitry S. Romanov

Publication date: 30 July 2015

Published in: Moscow University Computational Mathematics and Cybernetics (Search for Journal in Brave)

zbMATH Keywords

Shannon functioninverse faultchecking testcircuit of functional elementseasy-to-test circuit

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (3)

Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases ⋮ Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder

Cites Work

• Single fault detection tests for circuits of functional elements
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Unit checking output tests under constant faults for functional elements
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
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