Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints
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Publication:2369641
DOI10.1016/j.patcog.2005.12.004zbMath1158.68483OpenAlexW2142632277MaRDI QIDQ2369641
Publication date: 22 May 2006
Published in: Pattern Recognition (Search for Journal in Brave)
Full work available at URL: http://repository.ust.hk/ir/bitstream/1783.1-2482/1/yeung.pr2006a.pdf
Related Items (8)
Ordinal margin metric learning and its extension for cross-distribution image data ⋮ Distance metric learning guided adaptive subspace semi-supervised clustering ⋮ Learning a Mahalanobis distance metric for data clustering and classification ⋮ Semi-supervised clustering with metric learning: an adaptive kernel method ⋮ Non-linear metric learning using pairwise similarity and dissimilarity constraints and the geometrical structure of data ⋮ Supervised principal component analysis: visualization, classification and regression on subspaces and submanifolds ⋮ Supervised distance metric learning through maximization of the Jeffrey divergence ⋮ A Novel Semi-supervised Clustering Algorithm for Finding Clusters of Arbitrary Shapes
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