Localization of multiple faults with group control on a discrete device

DOI10.1134/S0005117917120074zbMath1390.90271OpenAlexW2774980819MaRDI QIDQ2412970

G. P. Aksenova

Publication date: 6 April 2018

Published in: Automation and Remote Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s0005117917120074

zbMATH Keywords

testingsignature analyzerfault localizationcontrol pointdiscrete device

Mathematics Subject Classification ID

Sensitivity (robustness) (93B35) Reliability, availability, maintenance, inspection in operations research (90B25) Decentralized systems (93A14)

Cites Work

• A matrix method for PLD failure localization
• Increasing resolvability for the matrix fault localization method
• Localization of faulty multi-output unit in discrete device
• Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops
• New Design for Testability Approach for Clock Fault Testing
• A low hardware overhead self-diagnosis technique using reed-solomon codes for self-repairing chips

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