Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator
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Publication:2420060
DOI10.1007/978-3-030-10692-8_30OpenAlexW2910623652MaRDI QIDQ2420060
Jose Luis Padilla, Cristina Medina-Bailon, Asen Asenov, Vihar Georgiev, Carlos Sampedro, Toufik Sadi, Luca Donetti, Francisco Gámiz
Publication date: 5 June 2019
Full work available at URL: http://eprints.gla.ac.uk/178378/2/178378.pdf
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