The inverse problem of estimating the film structure from X-ray reflection data

DOI10.1007/S10598-006-0018-0zbMath1125.65121OpenAlexW2066730836MaRDI QIDQ2458124

L. G. Yanusova, S. B. Astaf'ev, B. M. Shchedrin

Publication date: 31 October 2007

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-006-0018-0

zbMATH Keywords

inverse problemnumerical experimentsFourier coefficientsfilm on a substratefilm structuremultilayer film modelX-ray reflection experiment

Mathematics Subject Classification ID

Numerical methods for trigonometric approximation and interpolation (65T40) Fourier coefficients, Fourier series of functions with special properties, special Fourier series (42A16)

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