Maxx: Test pattern optimisation with local search over an extended logic

DOI10.1007/s10601-007-9025-9zbMath1125.68110OpenAlexW2088659816MaRDI QIDQ2460257

Francisco Azevedo

Publication date: 14 November 2007

Published in: Constraints (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10601-007-9025-9

zbMATH Keywords

PICLPConstraint logic programmingTest generationPrimary inputTG

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Problem solving in the context of artificial intelligence (heuristics, search strategies, etc.) (68T20) Logic programming (68N17)

Uses Software

• SICStus

Cites Work

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• Polynomially Complete Fault Detection Problems
• A Nine-Valued Circuit Model for Test Generation
• Diagnosis of Automata Failures: A Calculus and a Method
• A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits

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