A phase field model for the electromigration of intergranular voids

DOI10.4171/IFB/161zbMath1132.35082MaRDI QIDQ2468800

Robert Nürnberg, John W. Barrett, Harald Garcke

Publication date: 28 January 2008

Published in: Interfaces and Free Boundaries (Search for Journal in Brave)

zbMATH Keywords

convergence analysisphase field modelmatched asymptotic expansionsfinite elementfourth order degenerate parabolic equationvoid electromigration

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Degenerate parabolic equations (35K65) Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Dynamic and nonequilibrium phase transitions (general) in statistical mechanics (82C26)

Related Items (11)

A fitted finite element method for the numerical approximation of void electro-stress migration ⋮ Phase field simulation of healing and growth of voids in interconnects under electric field-induced interface migration ⋮ A structure‐preserving finite element approximation of surface diffusion for curve networks and surface clusters ⋮ Numerical simulation and linear well-posedness analysis for a class of three-phase boundary motion problems ⋮ The influence of electric fields on nanostructures-simulation and control ⋮ Sharp-Interface Limits of the Cahn--Hilliard Equation with Degenerate Mobility ⋮ The approximation of planar curve evolutions by stable fully implicit finite element schemes that equidistribute ⋮ Finite-element approximation of coupled surface and grain boundary motion with applications to thermal grooving and sintering ⋮ An unfitted finite element method for the numerical approximation of void electromigration ⋮ Numerical simulations of immiscible fluid clusters ⋮ How Do Degenerate Mobilities Determine Singularity Formation in Cahn--Hilliard Equations?

Uses Software

• ALBERTA

This page was built for publication: A phase field model for the electromigration of intergranular voids