Polynomial identity testing for depth 3 circuits

DOI10.1007/s00037-007-0226-9zbMath1173.94470OpenAlexW2177482211MaRDI QIDQ2472430

Neeraj Kayal, Nitin Saxena

Publication date: 22 February 2008

Published in: Computational Complexity (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00037-007-0226-9

zbMATH Keywords

ringsidentity testingChinese remainderdepth of circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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