Optimization of parallel-series self-testing for discrete devices

DOI10.1023/B:AURC.0000038732.75638.3DzbMath1079.68509OpenAlexW1984571683MaRDI QIDQ2487659

G. P. Aksenova

Publication date: 8 August 2005

Published in: Automation and Remote Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1023/b:aurc.0000038732.75638.3d

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

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