Optimal periodic testing policy for circuit with self-testing

DOI10.1016/J.CAMWA.2005.11.025zbMath1093.94036OpenAlexW2062998341MaRDI QIDQ2494804

Satoshi Mizutani, Hiroaki Sandoh, Kodo Ito, Toshio Nakagawa

Publication date: 30 June 2006

Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.camwa.2005.11.025

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (1)

A Maintenance Policy for a Parallel System With Cascading Failure

Cites Work

• Unnamed Item
• Random Pattern Testability
• On Random Pattern Test Length
• Probabilistic Treatment of General Combinational Networks
• The Error Latency of a Fault in a Sequential Digital Circuit

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