Teager-kaiser energy and higher-order operators in white-light interference microscopy for surface shape measurement

DOI10.1155/ASP.2005.2804zbMath1127.94330MaRDI QIDQ2502852

Abdel-Ouahab Boudraa, F. Salzenstein, Denis Montaner, Paul C. Montgomery

Publication date: 13 September 2006

Published in: EURASIP Journal on Applied Signal Processing (Search for Journal in Brave)

zbMATH Keywords

subsamplinghigher-order operatorsTeager-Kaiser energywhite-light interferometry

Mathematics Subject Classification ID

Signal theory (characterization, reconstruction, filtering, etc.) (94A12)

Related Items (2)

A new class of multi-dimensional Teager-Kaiser and higher order operators based on directional derivatives ⋮ Multi-dimensional higher order differential operators derived from the Teager-Kaiser energy-tracking function

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