A simplified analysis on buckling of stressed and pressurized thin films on substrates

DOI10.1007/s00419-013-0790-1zbMath1293.74134OpenAlexW2012507966MaRDI QIDQ2511592

Yongping Yu, Baisheng Wu

Publication date: 6 August 2014

Published in: Archive of Applied Mechanics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00419-013-0790-1

zbMATH Keywords

stabilitybucklingexplicit approximate solutionmismatched pressurestressed thin film

Mathematics Subject Classification ID

Bifurcation and buckling (74G60) Thin films (74K35)

Related Items (1)

Combined effect of pressure and geometric imperfection on buckling of stressed thin films on substrates

Cites Work

• The influence of imperfections on the nucleation and propagation of buckling driven delaminations
• Mixed Mode Cracking in Layered Materials
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