Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
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Publication:2513011
DOI10.3103/S0027132208050069zbMath1304.94140MaRDI QIDQ2513011
Publication date: 2 February 2015
Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)
Related Items (15)
The length of a single fault detection test for constant-nonpreserving element insertions ⋮ The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Short single fault detection tests for logic networks under arbitrary faults of gates ⋮ A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length ⋮ Short complete diagnostic tests for logic circuits in one infinite basis ⋮ On the exact value of the length of the minimal single diagnostic test for a particular class of circuits ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder ⋮ The length of single fault detection tests with respect to substitution of gates with inverters ⋮ Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
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