Easily tested circuits for linear functions

DOI10.3103/S0027132211040097zbMath1304.94129OpenAlexW2093970000MaRDI QIDQ2513230

S. R. Bedzhanova

Publication date: 2 February 2015

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s0027132211040097

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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