A complete critical path algorithm for test generation of combinational circuits

DOI10.1007/BF02943410zbMath0719.94515MaRDI QIDQ2640582

Quan Zhou, Daozheng Wei

Publication date: 1991

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Mathematics Subject Classification ID

Parallel algorithms in computer science (68W10) Information and communication theory, circuits (94-XX)

Cites Work

• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
• An Algorithm for the Generation of Test Sets for Combinational Logic Networks
• Properties of Faults and Criticalities of Values under Tests for Combinational Networks
• Diagnosis of Automata Failures: A Calculus and a Method
• Analyzing Errors with the Boolean Difference
• Unnamed Item

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