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Short complete diagnostic tests for circuits implementing linear Boolean functions

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Publication:2690960
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DOI10.1134/S0001434623010091OpenAlexW4323821484MaRDI QIDQ2690960

Kirill A. Popkov

Publication date: 17 March 2023

Published in: Mathematical Notes (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s0001434623010091

zbMATH Keywords

stuck-at faultlogic circuitlinear Boolean functioncomplete diagnostic test


Mathematics Subject Classification ID

Circuits, networks (94Cxx)




Cites Work

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  • On the length of diagnostic tests for Boolean circuits
  • Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
  • Short tests of closures for contact circuits
  • Easily tested circuits for linear functions
  • On Closedness and Test Complexity of Logic Circuits
  • On checking tests for a parity counter
  • Short complete diagnostic tests for circuits with one additional input in the standard basis
  • LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS
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