True worst-case circuit tolerance analysis using genetic algorithms and affine arithmetic
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Publication:2724325
DOI10.1109/81.883323zbMath1012.94557OpenAlexW2156268697MaRDI QIDQ2724325
Publication date: 16 June 2003
Published in: IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/81.883323
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