Finding ambiguity groups in low testability analog circuits

DOI10.1109/81.873868zbMath1001.94524OpenAlexW2148720062MaRDI QIDQ2724344

Maria Cristina Piccirilli, Stefano Manetti, Giulio Fedi, Jing Pang, Janusz A. Starzyk

Publication date: 15 December 2002

Published in: IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/d6378f93fd1b74955102702835a9d4b8a0bbcecd

zbMATH Keywords

QR factorizationambiguity groupsanalog fault diagnosisanalog system testing

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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Uses Software

• Matlab