A New Test for New Better Than Used in Expectation Lifetimes
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Publication:2807617
DOI10.1080/03610926.2013.824101zbMath1338.62133OpenAlexW1978978156MaRDI QIDQ2807617
Ganesh Malla, Edgardo Lorenzo, Hari Mukerjee
Publication date: 25 May 2016
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2013.824101
Nonparametric hypothesis testing (62G10) Censored data models (62N01) Reliability and life testing (62N05)
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Cites Work
- A generalized Hollander-Proschan type test for NBUE alternatives
- Estimation of a biometric function
- On The Performance of A New Test of Exponentiality Against IFR Alternatives Based on the L-statistic Approach
- Testing for new is better than used in expectation
- A class of tests for exponentiality against decreasing mean residual life alternatives
- A Comparative Study of Several One-Sided Goodness-of-Fit Tests
- Tests for the mean residual life
- Asymptotically Minimax Distribution-free Procedures
- Likelihood Ratio Tests for Restricted Families of Probability Distributions
- Testing Whether New is Better than Used
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