Reliability modeling of systems with two dependent degrading components based on gamma processes

DOI10.1080/03610926.2013.870201zbMath1338.62197OpenAlexW2297571234MaRDI QIDQ2811405

Zhengqiang Pan, Jing Feng, Quan Sun

Publication date: 10 June 2016

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2013.870201

zbMATH Keywords

system reliabilitygamma processBirnbaum-Saunders distributionBayesian MCMC methoddependent degrading components

Mathematics Subject Classification ID

Processes with independent increments; Lévy processes (60G51) Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30)

Related Items (5)

Degradation-Based Reliability Modeling of Complex Systems in Dynamic Environments ⋮ Gamma Degradation Models: Inference and Optimal Design ⋮ Estimation of model parameters of dependent processes constructed using Lévy Copulas ⋮ Bayesian estimation of reliability using time-to-failure distribution of parametric degradation models ⋮ Reliability assessment for products with two performance characteristics based on marginal stochastic processes and copulas

Cites Work

• Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
• Bivariate Birnbaum-Saunders distribution and associated inference
• Bayesian Modeling Using WinBUGS
• Renewal theory in two dimensions: asymptotic results
• Bivariate Gamma Random Vectors

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