Identifiability of masking probabilities in competing risks models with emphasis on Weibull models

DOI10.1080/03610926.2013.878358zbMath1341.62294OpenAlexW2301489039MaRDI QIDQ2811422

Dongchu Sun, Ye Liang

Publication date: 10 June 2016

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2013.878358

zbMATH Keywords

identifiabilitylifetime dataoverparameterizationmasked failure causesproportional hazard functions

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cites Work

• Inference for the dependent competing risks model with masked causes of failure
• Estimating system and component reliabilities under partial information on cause of failure
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Parametric modeling for survival with competing risks and masked failure causes
• Bayesian reliability modeling for masked system lifetime data
• Maximum likelihood analysis of masked series system lifetime data
• Inference based on the EM algorithm for the competing risks model with masked causes of failure
• Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure
• Bayesian Analysis of Masked Series System Lifetime Data
• Inference About the Masking Probabilities in the Competing Risks Model
• Maximum likelihood analysis of component reliability using masked system life-test data
• Survival with competing risks and masked causes of failures
• The Identification of Structural Characteristics

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