Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals

DOI10.1134/S1028335813010023zbMATH Open1274.82084OpenAlexW2083053948WikidataQ57670812 ScholiaQ57670812MaRDI QIDQ2840189

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Publication date: 17 July 2013

Published in: (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s1028335813010023

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