Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing
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Publication:2876122
DOI10.1080/03610918.2013.848894zbMath1462.62189OpenAlexW1998171786MaRDI QIDQ2876122
Qiang Guan, Ancha Xu, Yin-cai Tang
Publication date: 18 August 2014
Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2013.848894
Related Items (6)
Semiparametric estimation for proportional hazards mixture cure model allowing non-curable competing risk ⋮ Robust Bayesian analysis for parallel system with masked data under inverse Weibull lifetime distribution ⋮ Bayesian analysis for dependent competing risks model with masked causes of failure in step-stress accelerated life test under progressive hybrid censoring ⋮ Improved likelihood inferences for Weibull regression model ⋮ Inference for a series system with dependent masked data under progressive interval censoring ⋮ Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test
Cites Work
- Bayesian analysis for masked system failure data using non-identical Weibull models
- Bayesian analysis of incomplete time and cause of failure data
- Dependent masking and system life data analysis: Bayesian inference for two-component systems
- Bayesian reliability modeling for masked system lifetime data
- Maximum likelihood analysis of masked series system lifetime data
- Maximum likelihood analysis of component reliability using masked system life-test data
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Exact maximum likelihood estimation using masked system data
- Bayesian Inference for Masked System Lifetime Data
- Adaptive Rejection Sampling for Gibbs Sampling
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