Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure

DOI10.1080/03610926.2013.823503zbMath1462.62630OpenAlexW2079762539MaRDI QIDQ2876219

Chiranjit Mukhopadhyay, Soumya Roy

Publication date: 18 August 2014

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2013.823503

zbMATH Keywords

Gibbs samplinglog-concavityseries systemstress translation functioncommon shape parameter

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (4)

Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data ⋮ Bayesian analysis of constant-stress accelerated life test for the Weibull distribution using noninformative priors ⋮ Bayesian accelerated life testing under competing log-location-scale family of causes of failure ⋮ Bayesian accelerated life test plans for series systems with Weibull component lifetimes

Cites Work

• Objective Bayesian analysis of accelerated competing failure models under type-I censoring
• A general Bayes exponential inference model for accelerated life testing
• Competing failure modes in accelerated life testing
• Weibull accelerated life tests when there are competing causes of failure
• Accelerated life tests under competing weibull causes of failure
• Bayes estimation of hazard and acceleration in accelerated testing
• Accelerated Testing
• Weibull Models
• A Bayesian Analysis for Accelerated Lifetime Tests Under an Exponential Power Law Model with Threshold Stress
• Adaptive Rejection Sampling for Gibbs Sampling
• On Bayesian inference for proportional hazards models using noninformative priors

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