A Bounded Intensity Process Reliability Growth Model in a Bayes-Decision Framework

DOI10.1515/eqc.2010.013zbMath1247.62266OpenAlexW2046085717MaRDI QIDQ2915359

Nidhi Jain, Preeti Wanti Srivastava

Publication date: 16 September 2012

Published in: Economic Quality Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/eqc.2010.013

zbMATH Keywords

non-homogenous Poisson processbreak-even valuetest-find-test program

Mathematics Subject Classification ID

Bayesian problems; characterization of Bayes procedures (62C10) Reliability and life testing (62N05)

Cites Work

• A New Nonparametric Growth Model
• A nonparametric-Bayes reliability-growth model

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