Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering

DOI10.1134/S0965542514060104zbMath1313.82025MaRDI QIDQ2940498

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Publication date: 26 January 2015

Published in: Computational Mathematics and Mathematical Physics (Search for Journal in Brave)

zbMATH Keywords

inverse problemmultilayer nanostructuresquasi-optical approximation

Mathematics Subject Classification ID

Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46) Statistical mechanics of nanostructures and nanoparticles (82D80)

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Cites Work

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• Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays
• A combinatoric-approximation method for the decomposition and composition of systems, and finite topological spaces, lattices, and optimization
• Modeling of with axially symmetric self-focusing X-ray pulses in plasma

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