RDIS: Tolerating Many Stuck-At Faults in Resistive Memory

DOI10.1109/TC.2013.2295825zbMath1360.68239OpenAlexW2045440623MaRDI QIDQ2982366

Sangyeun Cho, Rakan Maddah, R. G. Melhem

Publication date: 16 May 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.2013.2295825

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

This page was built for publication: RDIS: Tolerating Many Stuck-At Faults in Resistive Memory