RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme

DOI10.1109/TC.2014.12zbMath1360.68227MaRDI QIDQ2982443

Chingyi Chen, Hsiu-Chuan Shih, Chih-He Lin, Shyh-Shyuan Sheu, Frederick T. Chen, Pi-Feng Chiu, Chengwen Wu

Publication date: 16 May 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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