Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip
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Publication:2985288
DOI10.1109/TC.2015.2493548zbMath1360.68292OpenAlexW2516697505MaRDI QIDQ2985288
Dong Xiang, Krishnendu Chakrabarty, Hideo Fujiwara
Publication date: 16 May 2017
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.2015.2493548
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