Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS

DOI10.1109/TC.2015.2479618zbMath1360.68241MaRDI QIDQ2985407

Panagiota Papavramidou, Michael Nicolaidis

Publication date: 16 May 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Mathematical problems of computer architecture (68M07) Reliability, testing and fault tolerance of networks and computer systems (68M15)

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