Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs

DOI10.1109/TC.2015.2479606zbMath1360.68249OpenAlexW2419236625MaRDI QIDQ2985413

Yiorgos Tsiatouhas, Yiorgos Sfikas

Publication date: 16 May 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.2015.2479606

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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