A short guide to pure point diffraction in cut-and-project sets

DOI10.1088/1751-8121/aa5d44zbMath1366.82058arXiv1606.08831OpenAlexW2464169931MaRDI QIDQ2988395

Nicolae Strungaru, Christoph Richard

Publication date: 19 May 2017

Published in: Journal of Physics A: Mathematical and Theoretical (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/1606.08831

zbMATH Keywords

diffractionPoisson summation formulacut-and-project schemeregular model set

Mathematics Subject Classification ID

Statistical mechanics of crystals (82D25) Entropy and other invariants (28D20) Lattice systems (Ising, dimer, Potts, etc.) and systems on graphs arising in equilibrium statistical mechanics (82B20)

Related Items (15)

On the (dis)continuity of the Fourier transform of measures ⋮ On sampling and interpolation by model sets ⋮ Fourier transformable measures with weak Meyer set support and their lift to the cut-and-project scheme ⋮ On the garden of Eden theorem for \(\mathscr{B}\)-free subshifts ⋮ Pure point diffraction and Poisson summation ⋮ Delone dynamical systems and spectral convergence ⋮ Why do (weak) Meyer sets diffract? ⋮ Tempered distributions with translation bounded measure as Fourier transform and the generalized Eberlein decomposition ⋮ Modulated crystals and almost periodic measures ⋮ Diffraction of return time measures ⋮ On weakly almost periodic measures ⋮ On the Fourier Transformability of Strongly Almost Periodic Measures ⋮ On the Fourier analysis of measures with Meyer set support ⋮ A note on measures vanishing at infinity ⋮ Leptin densities in amenable groups

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