An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method

DOI10.4208/NMTMA.2015.MY12031zbMath1363.82009OpenAlexW2478773782MaRDI QIDQ2991818

Qing Yang, Yi-Rang Yuan

Publication date: 10 August 2016

Published in: Numerical Mathematics: Theory, Methods and Applications (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/42a945cbd8ee501ba0097ec16f473fd56f388ad5

zbMATH Keywords

error boundcharacteristics-mixed finite element methodpost-processing stepthree-dimensional semiconductor devices

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15)

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