Investigation of the dark electrical characteristics of the lateral metal-semiconductor-metal photodetectors using two-dimensional numerical simulation
DOI10.1002/JNM.781zbMath1221.82133OpenAlexW2110152142MaRDI QIDQ3015384
Publication date: 13 July 2011
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.781
Numerical computation of solutions to systems of equations (65H10) Finite difference methods applied to problems in optics and electromagnetic theory (78M20) Statistical mechanics of semiconductors (82D37) Transport processes in time-dependent statistical mechanics (82C70) Statistical mechanics of metals (82D35) Finite difference methods for boundary value problems involving PDEs (65N06) Motion of charged particles (78A35)
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