Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
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Publication:3057821
DOI10.1515/DMA.2010.027zbMath1201.94149OpenAlexW2008465278MaRDI QIDQ3057821
P. A. Borodin, Yulia V. Borodina
Publication date: 17 November 2010
Published in: Discrete Mathematics and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/dma.2010.027
Related Items (14)
Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs ⋮ The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length ⋮ Some classes of easily testable circuits in the Zhegalkin basis ⋮ On the exact value of the length of the minimal single diagnostic test for a particular class of circuits ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ Short Complete Fault Detection Tests for Logic Networks with Fan-In Two ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder ⋮ The length of single fault detection tests with respect to substitution of gates with inverters ⋮ Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
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