A New Control Scheme Always Better Than X-Bar Chart

DOI10.1080/03610920903243744zbMath1202.62188OpenAlexW1966200948MaRDI QIDQ3064087

Chi-Hyuck Jun, Sang-Ho Lee

Publication date: 20 December 2010

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610920903243744

zbMATH Keywords

quality controlmultiple testingmean shiftaverage run length\(P\)-value

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Applications of statistics in engineering and industry; control charts (62P30) Paired and multiple comparisons; multiple testing (62J15)

Related Items (2)

A Process Monitoring Scheme Controlling False Discovery Rate ⋮ An exponentially weighted moving average chart controlling false discovery rate

Cites Work

• A Simple Method for Studying Run-Length Distributions of Exponentially Weighted Moving Average Charts
• A Direct Approach to False Discovery Rates
• Rectangular Confidence Regions for the Means of Multivariate Normal Distributions
• CONTINUOUS INSPECTION SCHEMES
• Discussion on “Is Average Run Length to False Alarm Always an Informative Criterion?” by Yajun Mei

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