Piecewise linear second moment statistical simulation of ICs affected by non-linear statistical effects

DOI10.1002/CTA.606zbMath1205.94132OpenAlexW4243581415MaRDI QIDQ3075928

Paolo Crippa, Claudio Turchetti, Simone Orcioni, Alessandro Curzi, Giorgio Biagetti

Publication date: 17 February 2011

Published in: International Journal of Circuit Theory and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/cta.606

zbMATH Keywords

integrated circuitsstochastic simulationsecond-order statisticsdevice mismatchnon-linear effectsnon-Monte Carlo simulationstochastic modified nodal analysis (SMNA)

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

Related Items (1)

Piecewise linear second moment statistical simulation of ICs affected by non-linear statistical effects

Cites Work

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